The European Physical Journal - Applied Physics: All issues
2024
Vol. 99
Vol. 99 - 2024
(in progress)
1-30
2023
Vol. 98
E1-35
2022
Vol. 97
22-85
2021
Vol. 93-96
30101-30701
20101-21301
10201-11301
31101-30801
20401-20901
10201-10601
30101-31101
20101-20402
10101-10403
30901-30902
20901-21302
10201-11301
2020
Vol. 89-92
30401-30903
20902-20901
10905-11301
30902-31001
20801-21301
10101-10903
30101-31101
20101-20301
10902-11001
30101-30901
20902-20901
10101-10901
2019
Vol. 85-88
30102-30801
20901-20904
10901-11001
30902-31302
20903-21301
10301-11301
30902-30901
20901-20202
10201-11301
30101-30701
20401-21302
10902-10901
2018
Vol. 81-84
30102-30801
20301-20801
10902-10901
30902-30904
20502-20802
10901-10701
30201-31401
20101-21302
10801-11101
30201-30901
20101-21301
10803-11102
2017
Vol. 77-80
30301-30901
20201-21001
10701-11201
30801-31101
20801-21301
10801-11101
34801-34815
Special issue
Materials for Energy harvesting, conversion and storage II (ICOME 2016)
20802-20803
10801-11101
30801-30701
20101-21101
10101-11101
2016
Vol. 73-76
30301-31001
20101-20901
10101-10803
30201-30001
24701-24718
Special issue
6th Central European Symposium on Plasma Chemistry (CESPC-6)
10301-11301
30101-31001
24601-24616
Special issue
Materials for Energy Harvesting, Conversion and Storage (ICOME 2015)
10903-10902
30901-31101
20601-21201
11301-10904
2015
Vol. 69-72
30101-31301
20101-21001
10501-11101
31001-31302
20801-20812
The 14th International Symposium on High Pressure Low Temperature Plasma Chemistry (HAKONE XIV)
10901-11102
30102-31301
20902-21301
10101-10902
30301-31301
20101-21201
10201-11301
2014
Vol. 65-68
Archive
30201-31301
20101-21302
10101-10901
30201-31101
20301-21301
10101-11201
30101-31301
20101-20903
10101-10904
30101-31303
20101-20801
10101-11301
2013
Vol. 61-64
Archive
30101-31303
24501-21101
10801-11301
30201-30001
20101-21301
14401-11301
International Semiconductor Conference Dresden-Grenoble – ISCDG 2012
30101-31201
20101-21201
10201-11302
30101-30901
24301-24326
Topical issue: 13th International Symposium on High Pressure Low Temperature Plasma Chemistry (Hakone XIII). Edited by Nicolas Gherardi, Henryca Danuta Stryczewska and Yvan Ségui
10101-11201
2012
Vol. 57-60
Archive
30101-31303
24201-21003
Topical issue: New trends in porous media. Edited by D. Salin
10101-11101
30101-31301
20101-20801
10001-11303
30101-31201
20101-21101
10101-11301
30101-31301
20101-21303
10101-11302
2011
Vol. 53-56
Archive
24001-24027
Special issue
Topical Issue: 18th International Colloquium on Plasma Processes (CIP 2011)
13701-11404
Topical Issue: 5th Colloquium Interdisciplinary in Instrumentation (C2I) 2010
30101-31303
23901-21102
International Symposium on Flexible Organic Electronics 2010 (ISFOE)
33501-30001
Focus on Recent advances in (S)TEM and related spectroscopies: a tribute to C. Colliex
10101-11302
20301-21501
10301-11502
2010
Vol. 49-52
Archive
30301-31601
10401-11302
20101-21401
10301-11501
30301-31401
20101-21601
2009
Vol. 45-48
Archive
30301-31301
20301-21202
10301-11201
30301-31401
22801-22821
Special issue
11th International Symposium on High Pressure, Low Temperature Plasma Chemistry (HAKONE XI)
20101-21201
12501-12513
Special issue
International Symposium on Flexible Organic Electronics (IS-FOE)
30101-31101
20301-21202
10301-11302
2008
Vol. 41-44
Archive
pp. 217-322
pp. 109-215
pp. 269-368
Special issue
Topical Issue ITFPC (Innovations on Thin Films Processing and Characterisation)
pp. 1-137
pp. 177-359
pp. 67-175
pp. 1-66
Special issue
16th International Colloquium on Plasma Processes (CIP 2007)
pp. 181-264
pp. 91-179
pp. 1-90
2007
Vol. 37-40
Archive
pp. 241-356
pp. 125-239
pp. 1-123
pp. 203-274
pp. 1-75
pp. 197-297
pp. 107-195
pp. 1-105
pp. 237-352
pp. 119-235
pp. 1-118
2006
Vol. 33-36
Archive
pp. 197-311
pp. 91-209
pp. 1-89
pp. 149-221
pp. 75-148
pp. 1-74
pp. 165-251
pp. 1-71
pp. 153-228
pp. 77-150
pp. 1-76
2005
Vol. 29-32
Archive
pp. 149-221
pp. 73-147
pp. 1-71
pp. 153-223
pp. 79-152
pp. 3-76
pp. 153-222
pp. 77-148
pp. 3-73
pp. 203-274
pp. 127-199
pp. 3-123
2004
Vol. 25-28
Archive
pp. 265-381
pp. 153-152
pp. 3-122
pp. 7-506
Special issue
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
pp. 75-143
pp. 3-72
pp. 151-217
pp. 77-148
pp. 3-74
2003
Vol. 21-24
Archive
pp. 171-239
pp. 95-165
pp. 3-91
pp. 149-233
pp. 75-145
pp. 3-71
pp. 165-235
pp. 77-162
pp. 3-73
pp. 163-250
pp. 91-159
pp. 3-87
2002
Vol. 17-20
Archive
pp. 3-74
pp. 153-223
pp. 77-150
pp. 3-74
pp. 155-227
pp. 79-151
pp. 3-75
pp. 173-252
pp. 87-169
pp. 3-84
2001
Vol. 13-16
Archive
pp. 247-245
pp. 87-164
pp. 3-84
pp. 153-229
pp. 79-150
pp. 3-76
pp. 155-231
pp. 121-152
pp. 3-76
pp. 157-228
pp. 77-152
pp. 1-73
2000
Vol. 9-12
Archive
pp. 159-238
pp. 79-153
pp. 3-74
pp. 155-229
pp. 79-151
pp. 3-76
pp. 167-239
pp. 91-162
pp. 3-86
pp. 181-264
pp. 89-175
pp. 1-85
1999
Vol. 5-8
Archive
pp. 197-283
pp. 99-194
pp. 1-96
pp. 197-289
pp. 99-196
pp. 1-96
pp. 225-333
pp. 111-221
pp. 1-108
pp. 221-325
pp. 111-215
pp. 1-109
1998
Vol. 1-4
Archive
pp. I / 235-336
pp. 117-233
pp. 1-116
pp. 233-358
pp. 123-232
pp. 1-122
pp. 197-297
pp. 99-195
pp. 1-97
pp. 279-375
pp. 141-278
pp. IX / 1-138