The European Physical Journal - Applied Physics: All issues

2017 Vol. 77-80
10101-11201
34801-34815 Special issue
Materials for Energy harvesting, conversion and storage II (ICOME 2016)
2016 Vol. 73-76
24701-24718 Special issue
6th Central European Symposium on Plasma Chemistry (CESPC-6)
24601-24616 Special issue
Materials for Energy Harvesting, Conversion and Storage (ICOME 2015)
2013 Vol. 61-64
10001-14408
International Semiconductor Conference Dresden-Grenoble – ISCDG 2012
24301-24326
Topical issue: 13th International Symposium on High Pressure Low Temperature Plasma Chemistry (Hakone XIII). Edited by Nicolas Gherardi, Henryca Danuta Stryczewska and Yvan Ségui
2011 Vol. 53-56
30201-34108
Focus on organic electronic devices
24001-24027 Special issue
Topical Issue: 18th International Colloquium on Plasma Processes (CIP 2011)
10101-13705
Topical Issue: 5th Colloquium Interdisciplinary in Instrumentation (C2I) 2010
20101-23907
International Symposium on Flexible Organic Electronics 2010 (ISFOE)
10101-13813
Focus on Hakone XII
30001-33512
Focus on Recent advances in (S)TEM and related spectroscopies: a tribute to C. Colliex
20701-23412
Focus on Fuel Cells 2009
30101-33609
Focus on Telecom 2009 & JFMMA
2010 Vol. 49-52
20301-23311
Focus on Numelec
30301-33212
Focus on Flexible Organic Electronics
10301-12904
Focus on Electrical Contacts
30301-33007
Focus on Metamaterials
20101-22910
International Conference on Electrical Contacts (ICEC 2008)
10301-13112
17th International Colloquium on Plasma Processes (CIP 2009)
2009 Vol. 45-48
22801-22821 Special issue
11th International Symposium on High Pressure, Low Temperature Plasma Chemistry (HAKONE XI)
10301-12707
4th Colloquium Interdisciplinary in Instrumentation (C2I 2007)
30701-32611
Metamaterials
12501-12513 Special issue
International Symposium on Flexible Organic Electronics (IS-FOE)
2008 Vol. 41-44
pp. 1-107
10th Meeting of the French Microscopy Society (SFMU)
pp. 269-368 Special issue
Topical Issue ITFPC (Innovations on Thin Films Processing and Characterisation)
pp. 145-268
Reliability in Electromagnetic Systems (IET)
pp. 1-66 Special issue
16th International Colloquium on Plasma Processes (CIP 2007)
2004 Vol. 25-28
pp. 7-506 Special issue
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
pp. 151-234
14th International Colloquium on Plasma Processes (CIP 2003)