Current-voltage-temperature analysis of inhomogeneous Au/n-GaAs Schottky contacts p. 79 M. Biber, C. Coşkun and A. Türüt Published online: 18 August 2005 DOI: https://doi.org/10.1051/epjap:2005050 AbstractPDF (498.9 KB)References
Enhancement of the optical and electrical properties of ITO thin films deposited by electron beam evaporation technique p. 87 H. M. Ali, H. A. Mohamed and S. H. Mohamed Published online: 11 July 2005 DOI: https://doi.org/10.1051/epjap:2005044 AbstractPDF (2.379 MB)References
Effect of annealing and In content on the properties of electron beam evaporated ZnO films p. 95 S. H. Mohamed, H. M. Ali, H. A. Mohamed and A. M. Salem Published online: 18 August 2005 DOI: https://doi.org/10.1051/epjap:2005052 AbstractPDF (1.484 MB)References
Substrate temperature dependence on the optical properties of Cu and Ag thin films p. 101 H. Savaloni and Ahmad Reza Khakpour Published online: 18 August 2005 DOI: https://doi.org/10.1051/epjap:2005053 AbstractPDF (664.3 KB)References
Two-dimensional electromagnetic fluctuations in arbitrary geometries p. 113 I. Dorofeyev Published online: 18 August 2005 DOI: https://doi.org/10.1051/epjap:2005051 AbstractPDF (379.8 KB)References
A magneto-optical apparatus for boundary localization of ternary phase diagrams p. 127 S. Désert, M. Delsanti and T. Zemb Published online: 18 August 2005 DOI: https://doi.org/10.1051/epjap:2005046 AbstractPDF (855.7 KB)References
Production of gold tips for tip-enhanced near-field optical microscopy and spectroscopy: analysis of the etching parameters p. 139 L. Billot, L. Berguiga, M. L. de la Chapelle, Y. Gilbert and R. Bachelot Published online: 18 August 2005 DOI: https://doi.org/10.1051/epjap:2005049 AbstractPDF (1.459 MB)References
MONOX: a characterization tool for the X-UV range p. 147 J.-M. André, A. Avila, R. Barchewitz, R. Benbalagh, R. Delaunay, D. Druart, P. Jonnard and H. Ringuenet Published online: 18 August 2005 DOI: https://doi.org/10.1051/epjap:2005047 AbstractPDF (332.1 KB)References