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Volume 17 / No 2 (February 2002)

The European Physical Journal Applied Physics

Volume 17 / No 2 (February 2002)

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Semiconductors and Devices

Yttrium implantation and addition element effects on high temperature oxidation behaviour of reference steels p. 87

E. Caudron, F. Riffard, H. Buscail, R. Cueff, C. Issartel and S. Perrier

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002001

Organic Materials and Devices

Study of Ag porous film using X-ray reflectivity and pattern formation using Atomic Force Microscope p. 99

S. Banerjee, S. Mukherjee and S. Kundu

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002002

Nanomaterials and Nanotechnologies

Optimal dimensioning of a piezoelectric bimorph actuator p. 107

V. Monturet and B. Nogarede

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002003

Imaging, Microscopy and Spectroscopy

Polystyrene thin films treatment under DC pulsed discharges conditions in nitrogen-argon and oxygen-argon mixtures p. 119

F. Clément, B. Held and N. Soulem

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002004

Plasma, Discharges and Processes

Molecular flows in annuli with corrugated walls p. 131

Kwang-Hua W. Chu

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002005

Physics of Energy Generation, Conversion and Storage

Tridimensional flow in uniformly collapsed tubes: wall shear stress p. 139

S. Naili, M. Thiriet and C. Ribreau

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002006

Effect of shear stress and of transmural pressure on cAMP-dependent responses of cells adhering to a biomaterial p. 155

R. Chotard-Ghodsnia, A. Drochon, N. Faucheux, M.-D. Nagel and R. Grebe

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002007

Instrumentation and Metrology

Improvement of the minimal characterisation size available by acoustic microscopy for mechanical parameters evaluation - Micro-defocusing: methods and application p. 163

D. Laux, G. Despaux and F. Augereau

Published online: 15 February 2002

DOI: https://doi.org/10.1051/epjap:2002008