High-density microwave plasma of SiH4/H2 for high rate growth of highly crystallized microcrystalline silicon films p. 153 H. Jia, J. K. Saha, N. Ohse and H. Shirai Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006018 AbstractPDF (723.7 KB)References
Oscillatory structure in radiation spectra of individual microplasmas in silicon carbide p-n-junctions p. 161 A. M. Genkin, V. K. Genkina, L. P. Germash and S. M. Zubkova Published online: 04 April 2006 DOI: https://doi.org/10.1051/epjap:2006023 AbstractPDF (298.9 KB)References
Pre-exponential factor for the crystallization of some chalcogenide glasses: applicability of Meyer-Neldel rule p. 169 N. Mehta, D. Kumar and A. Kumar Published online: 04 April 2006 DOI: https://doi.org/10.1051/epjap:2006024 AbstractPDF (202.6 KB)References
Field and temperature effects on the electronic mobility in Alq3 structures p. 175 A. Moliton, W. Rammal and B. Lucas Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006022 AbstractPDF (500.7 KB)References
Optimization of an optical system used for laser beam transformation p. 183 Chongguang Li, Agnès Delmas and Junchang Li Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006014 AbstractPDF (1.027 MB)References
Structural, AC conductivity and dielectric properties of Sr-La hexaferrite p. 189 A. Singh, S. B. Narang, K. Singh, P. Sharma and O. P. Pandey Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006016 AbstractPDF (345.3 KB)References
Energy deposition effect on the NOx remediation in oxidative media using atmospheric non thermal plasmas p. 195 A. Khacef, J. M. Cormier and J. M. Pouvesle Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006019 AbstractPDF (343.7 KB)References
Formation of ion acoustic weak double layers in a dusty plasma p. 199 Samiran Ghosh Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006013 AbstractPDF (172.1 KB)References
Is actinometry reliable for monitoring Si and silicone halides produced in silicon etching plasmas? A comparison with their absolute densities measured by UV broad band absorption p. 205 M. Kogelschatz, G. Cunge and N. Sadeghi Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006021 AbstractPDF (601.2 KB)References
Light emission from corona discharge in SF6 and SF6/N2 gas mixtures at high pressure p. 213 A. Lemzadmi, N. Bonifaci, A. Denat and M. Nemamcha Published online: 04 April 2006 DOI: https://doi.org/10.1051/epjap:2006025 AbstractPDF (639.4 KB)References
A sound card based multi-channel frequency measurement system p. 221 S. Groeger, G. Bison, P. E. Knowles and A. Weis Published online: 22 February 2006 DOI: https://doi.org/10.1051/epjap:2006020 AbstractPDF (167.0 KB)References
Experimental assessment of relative temporal fluctuation of CCD pixels p. 225 A. Ferrero, J. Campos and A. Pons Published online: 04 April 2006 DOI: https://doi.org/10.1051/epjap:2006026 AbstractPDF (322.7 KB)References