Improved varistor nonlinearity via sintering and acceptor impurity doping p. 155 Y. J. Wang, J. F. Wang, C. P. Li, H. C. Chen, W. B. Su, W. L. Zhong, P. L. Zhang and L. Y. Zhao Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000157 PDF (119.3 KB)References
Optical properties of CdI2 thin films p. 159 A. E. Bekheet, M. A. M. Seyam, F. M. Sallam and H. T. El-Shair Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000158 PDF (235.9 KB)References
Investigation of the structure of tungsten oxide films obtained by chemical vapor deposition p. 167 D. Gogova, K. Gesheva, A. Kakanakova-Georgieva and M. Surtchev Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000159 PDF (157.1 KB)References
3D computation of a claw pole permanent magnet machine using a scalar potential formulation p. 175 Y. Le Menach, S. Clénet, F. Piriou, J. F. Létourneau, P. Viarouge and J. Cros Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000160 PDF (551.2 KB)References
Modelling of a transverse Vernier hybrid reluctance motor p. 183 D. Hadjidj, A. Miraoui and J. M. Kauffmann Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000161 PDF (332.8 KB)References
Two photon absorption in semi-insulating gallium arsenide photoconductive switch irradiated by a picosecond infrared laser p. 189 F. Lacassie, D. Kaplan, Th. De Saxce and P. Pignolet Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000162 PDF (168.4 KB)References
3D modeling of the heating of a metal sheet by a moving arc: application to aircraft lightning protection p. 197 Ph. Testé, T. Leblanc, F. Uhlig and J.-P. Chabrerie Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000163 PDF (334.1 KB)References
Groove dimensioning using remote field eddy current inspection p. 205 M.-E. Davoust and G. Fleury Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000164 PDF (353.4 KB)References
Comparison of intracellular water content measurements by dark-field imaging and EELS in medium voltage TEM p. 215 C. Terryn, J. Michel, L. Kilian, P. Bonhomme and G. Balossier Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000156 PDF (662.9 KB)References
Noise measurements on single electron transistors using bias switching read-out p. 227 P. J. Hakonen, M. Kiviranta, J. S. Penttilä and M. A. Paalanen Published online: 15 September 2000 DOI: https://doi.org/10.1051/epjap:2000165 PDF (155.7 KB)References