The European Physical Journal Applied Physics

Improved varistor nonlinearity via sintering and acceptor impurity doping p. 155

Y. J. Wang, J. F. Wang, C. P. Li, H. C. Chen, W. B. Su, W. L. Zhong, P. L. Zhang and L. Y. Zhao

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000157

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Optical properties of CdI₂ thin films p. 159

A. E. Bekheet, M. A. M. Seyam, F. M. Sallam and H. T. El-Shair

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000158

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Investigation of the structure of tungsten oxide films obtained by chemical vapor deposition p. 167

D. Gogova, K. Gesheva, A. Kakanakova-Georgieva and M. Surtchev

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000159

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3D computation of a claw pole permanent magnet machine using a scalar potential formulation p. 175

Y. Le Menach, S. Clénet, F. Piriou, J. F. Létourneau, P. Viarouge and J. Cros

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000160

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Modelling of a transverse Vernier hybrid reluctance motor p. 183

D. Hadjidj, A. Miraoui and J. M. Kauffmann

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000161

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Two photon absorption in semi-insulating gallium arsenide photoconductive switch irradiated by a picosecond infrared laser p. 189

F. Lacassie, D. Kaplan, Th. De Saxce and P. Pignolet

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000162

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3D modeling of the heating of a metal sheet by a moving arc: application to aircraft lightning protection p. 197

Ph. Testé, T. Leblanc, F. Uhlig and J.-P. Chabrerie

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000163

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Groove dimensioning using remote field eddy current inspection p. 205

M.-E. Davoust and G. Fleury

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000164

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Comparison of intracellular water content measurements by dark-field imaging and EELS in medium voltage TEM p. 215

C. Terryn, J. Michel, L. Kilian, P. Bonhomme and G. Balossier

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000156

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Noise measurements on single electron transistors using bias switching read-out p. 227

P. J. Hakonen, M. Kiviranta, J. S. Penttilä and M. A. Paalanen

Published online: 15 September 2000

DOI: https://doi.org/10.1051/epjap:2000165

• Abstract
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