The European Physical Journal Applied Physics
Volume 26 / No 2 (May 2004)
Semiconductors and Devices
Surfaces, Interfaces and Films
TEM measurement of the misfit stress by a curvature method in semiconducting epitaxial system p. 87
Published online: 29 March 2004
Laser, Optics, Optoelectronics and Nanophotonics
Optical properties of Ce3+/Tb3+-codoped borosilicate glass p. 95
Published online: 10 March 2004
Imaging, Microscopy and Spectroscopy
Plasma, Discharges and Processes
Instrumentation and Metrology
High resolution microscopy techniques for the analysis of biological samples: a comparison p. 123
Published online: 07 April 2004
Physics of Biological Systems
Direct comparison of simplified models of surface reacting flows in flow chambers p. 133
Published online: 07 April 2004