Semiconductors and Devices

Breakdown voltage analysis of neutron irradiated silicon detectors p. 171

A. Bhardwaj, K. Ranjan, Namrata, S. Chatterji, A. K. Srivastava, A. Kumar, M. K. Jha and R. K. Shivpuri

Published online: 03 October 2003

DOI: https://doi.org/10.1051/epjap:2003073-1

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Influence of an applied electric field on the electronic properties of Si δ-doped GaAs p. 189

E. Ozturk, Y. Ergun, H. Sari and I. Sokmen

Published online: 03 October 2003

DOI: https://doi.org/10.1051/epjap:2003074

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Organic Materials and Devices

Degradation kinetics of the spectral emission in polyfluorene light-emitting electro-chemical cells and diodes p. 195

T. Ouisse, O. Stéphan and M. Armand

Published online: 16 September 2003

DOI: https://doi.org/10.1051/epjap:2003067

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Magnetism, Superconductivity and Related Devices

Study of high intensity magnetic separation process in grooved plate matrix p. 201

N. M. Sido, A. Mailfert, G. Gillet and A. Colteu

Published online: 20 October 2003

DOI: https://doi.org/10.1051/epjap:2003077

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Imaging, Microscopy and Spectroscopy

Crystal-field analysis of the Cr⁴⁺ absorption and excitation spectrum in LiGaO₂ oxide crystal p. 209

S. Kammoun and M. Kamoun

Published online: 16 September 2003

DOI: https://doi.org/10.1051/epjap:2003065

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Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction p. 215

J.-L. Maurice, F. Pailloux, D. Imhoff, N. Bonnet, L. Samet, A. Barthélémy, J.-P. Contour, C. Colliex and A. Fert

Published online: 03 October 2003

DOI: https://doi.org/10.1051/epjap:2003071

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Identification of physical effects in flying spot photothermal non-destructive testing p. 223

S. Hermosilla-Lara, P.-Y. Joubert and D. Placko

Published online: 25 November 2003

DOI: https://doi.org/10.1051/epjap:2003081

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Instrumentation and Metrology

Calibration of a 2 dimensional hydrogenated amorphous silicon thin film position sensitive detector (2D a-Si:H TFPSD) p. 231

K. Gnanvo and Z. Y. Wu

Published online: 03 October 2003

DOI: https://doi.org/10.1051/epjap:2003072

• Abstract
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