Semiconductors and Devices

An analysis of elementary dislocations in icosahedral Al-Pd-Mn by Large Angle Convergent-Beam Electron Diffraction (LACBED) p. 3

D. Caillard, J.-P. Morniroli, G. Vanderschaeve, L. Bresson and D. Gratias

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002069

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Enhancement of longitudinal Kerr rotation in Fe/Al₂O₃ composite multilayers p. 9

A. Bourzami, O. Lenoble, J. F. Bobo, A. Layadi and M. Piecuch

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002070

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Organic Materials and Devices

Free surface deformation of irradiated thin slabs p. 15

D. Lesueur, J. Colin and J. Grilhé

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002071

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Core-shell bimetallic particles, prepared by sequential impregnations p. 23

S. Giorgio and C. R. Henry

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002072

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Surfaces, Interfaces and Films

Comparative analysis of the Cr³⁺ centre spectroscopic properties in LiNbO₃ crystals from congruent to nearly stoichiometric compositions p. 29

F. Lhommé, P. Bourson, G. Boulon, Y. Guyot and M. D. Fontana

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002073

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Interpretation method for mirror experiments based on a Monte Carlo charge implantation model p. 41

F. Mady, R. Renoud, C. Attard, J. Bigarré, J.-P. Ganachaud and P. Hourquebie

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002074

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Imaging, Microscopy and Spectroscopy

Study of the arc dynamics by means of optical and magnetic measurements p. 55

J. P. Toumazet, C. Brdys, E. Debellut and J. L. Ponthenier

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002075

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Instrumentation and Metrology

RF behaviour of 3 GHz SCDTL structures p. 61

L. Picardi, C. Ronsivalle and B. Spataro

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002076

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A new approach to estimate the geometrical factors, solid angle approximation, geometrical efficiency and their use in basic interaction cross section measurements p. 69

D. V. Rao, R. Cesareo, A. Brunetti, G. E. Gigante, T. Takeda, Y. Itai and T. Akatsuka

Published online: 01 October 2002

DOI: https://doi.org/10.1051/epjap:2002077

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