The European Physical Journal Applied Physics

Volume 23 / No 1 (July 2003)

Export the citation of the selected articles Export
Select all

Editorial

Foreword SDE p. 3

Bernard Pichaud

Published online: 27 June 2003

DOI: https://doi.org/10.1051/epjap:2003046

Semiconductors and Devices

Identification of hydrogen related defects in proton implanted float-zone silicon p. 5

P. Lévêque, A Hallén, B. G. Svensson, J. Wong-Leung, C. Jagadish and V. Privitera

Published online: 29 November 2002

DOI: https://doi.org/10.1051/epjap:2002113

Deuteron implantation into hexagonal silicon carbide: defects and deuterium behaviour p. 11

A. Shiryaev, A. van Veen, A. Rivera, M. van Huis, T. Bus, W. M. Arnoldbik, N. Tomozeiu, F. H. P. M. Habraken, R. Delamare and E. Ntsoenzok

Published online: 29 November 2002

DOI: https://doi.org/10.1051/epjap:2002116

Evolution of He-induced cavities and related defects in silicon studied by direct scattering of channeled particles p. 19

A. Grob, J. J. Grob and F. Roqueta

Published online: 29 November 2002

DOI: https://doi.org/10.1051/epjap:2002115

μ-Raman investigations of plasma hydrogenated silicon p. 25

R. Job, A. G. Ulyashin, W. R. Fahrner, M.-F. Beaufort and J.-F. Barbot

Published online: 25 February 2003

DOI: https://doi.org/10.1051/epjap:2003013

p-type doping by platinum diffusion in low phosphorus doped silicon p. 33

L. Ventura, B. Pichaud, W. Vervisch and F. Lanois

Published online: 29 November 2002

DOI: https://doi.org/10.1051/epjap:2002114

In-situ microscopy study of nanocavity shrinkage in Si under ion beam irradiation p. 39

M.-O. Ruault, M. C. Ridgway, F. Fortuna, H. Bernas and J. S. Williams

Published online: 11 December 2002

DOI: https://doi.org/10.1051/epjap:2002120

Impact of gettering by helium implantation on boron and iron segregation p. 41

F. Cayrel, D. Alquier, L. Ventura and F. Roqueta

Published online: 27 June 2003

DOI: https://doi.org/10.1051/epjap:2003048

The role of a top oxide layer in cavities formed by MeV He implantation into Si p. 45

C. Liu, E. Ntsoenzok, R. Delamare, D. Alquier and G. Regula

Published online: 12 June 2003

DOI: https://doi.org/10.1051/epjap:2003038

Magnetism, Superconductivity and Related Devices

Structure related magnetic properties of MnZn ferrite with ultra-fine grain structure p. 49

J. Moulin, F. Mazaleyrat, Y. Champion, P. Langlois, M. Lécrivain, J. M. Grenèche, D. Michel and R. Barrué

Published online: 12 June 2003

DOI: https://doi.org/10.1051/epjap:2003040

Bus bar copper losses computation p. 55

M. Besacier, J. M. Guichon, J. L. Schanen and J. Roudet

Published online: 12 June 2003

DOI: https://doi.org/10.1051/epjap:2003041

Imaging, Microscopy and Spectroscopy

A new numerical technique of electric field determination within dielectric materials plate and cable using the TSM method p. 63

E. Belgaroui, H. Guermazi, S. Agnel, Y. Mlik and A. Toureille

Published online: 12 June 2003

DOI: https://doi.org/10.1051/epjap:2003042