Semiconductors and Related Materials

Structural and optical properties of flash evaporated AgInTe₂ thin films p. 75

M. M. El-Nahass, A. M. A. El-Barry, A. A. Farag and S. Y. El-Soly

Published online: 12 July 2006

DOI: https://doi.org/10.1051/epjap:2006078

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Microelectronics and Optoelectronics

Influence of the geometrical parameters on the conductivity percolation threshold p. 85

M. Ambrožič, A. Dakskobler and M. Valant

Published online: 19 July 2006

DOI: https://doi.org/10.1051/epjap:2006083

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Surfaces, Interfaces and Films

Sputtered-deposited thin brass films in a modified glow discharge Grimm-type source p. 93

K. I. Grais, M. A. Eid, N. L. Tawfik, M. S. Abd-El-Aal and A. A. Shaltout

Published online: 19 July 2006

DOI: https://doi.org/10.1051/epjap:2006071

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Model for porous alumina template formation: constant voltage anodization p. 107

P. Singaraju, R. Venkat, R. Kanakala and B. Das

Published online: 12 July 2006

DOI: https://doi.org/10.1051/epjap:2006081

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Nanomaterials and Nanotechnologies

Singular localised states in quasiperiodic GaAs/Al_xGa_{1 − x} As Fibonacci superlattices p. 113

Z. Aziz, S. Bentata and R. Djelti

Published online: 19 July 2006

DOI: https://doi.org/10.1051/epjap:2006086

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Laser and Optics

Intensity noise measurement of strongly attenuated laser diode pulses in the time domain p. 117

Quyên Dinh Xuân, R. Alléaume, Liantuan Xiao, F. Treussart, B. Journet and J.-F. Roch

Published online: 12 July 2006

DOI: https://doi.org/10.1051/epjap:2006079

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Collective effects in the Thomson back-scattering between a laser pulse and a relativistic electron beam p. 123

A. Bacci, C. Maroli, V. Petrillo and L. Serafini

Published online: 12 July 2006

DOI: https://doi.org/10.1051/epjap:2006080

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Magnetism and Superconductivity

A model for achieving 1 terabit/sq.in. storage density by heat-assisted magnetic probe recording p. 131

L. Zhang

Published online: 13 July 2006

DOI: https://doi.org/10.1051/epjap:2006084

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Plasma, Discharge and Processes

Chemical kinetics of an argon/methane plasma in a hydrogen reforming reactor p. 135

R. Barni, R. Benocci, C. Broggi and C. Riccardi

Published online: 06 July 2006

DOI: https://doi.org/10.1051/epjap:2006077

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Instrumentation and Metrology

Metrological analysis of shearography p. 145

F. Taillade

Published online: 12 July 2006

DOI: https://doi.org/10.1051/epjap:2006082

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