The European Physical Journal Applied Physics

Volume 40 / No 2 (November 2007)

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Semiconductors and Related Materials

Microelectronics and Optoelectronics

Surfaces, Interfaces and Films

Laser and Optics

Characterization of Materials: Imaging, Microscopy and Spectroscopy

Instrumentation and Metrology

Physics and Mechanics of Fluids, Microfluidics