Eur. Phys. J. Appl. Phys.
Volume 40, Number 2, November 2007
|Page(s)||197 - 201|
|Section||Characterization of Materials: Imaging, Microscopy and Spectroscopy|
|Published online||31 October 2007|
Comparative study of atomic force mode and tunneling mode tip-enhanced Raman spectroscopy
LPICM, École Polytechnique, CNRS, 91128 Palaiseau, France
2 HORIBA Jobin Yvon SAS, Raman Division, 231 rue de Lille, 59650 Villeneuve d'Ascq, France
Corresponding author: firstname.lastname@example.org
Accepted: 22 August 2007
Published online: 31 October 2007
In Tip-Enhanced Raman Spectroscopy (TERS) a metal (or metallized) sharp tip is used to enhance the electromagnetic field by a localized surface-plasmon excitation. Two different modes – atomic force mode (AFM) and scanning tunneling mode (STM) – together with their respective types of probe tips are used in TERS experiments. We have compared the efficiency in enhancing the Raman signal on a thin dye layer for metal-coated AFM tips as well as for electrochemically etched metal STM tips. A much higher enhancement factor and better reproducibility were found when using STM tips. The very different performance is mainly attributed to the more efficient plasmonic excitation when using bulk-metal tips and possibly to the morphological differences in the tip and apex shapes existing between the two tip types.
PACS: 07.79.Fc – Near-field scanning optical microscopes / 07.79.Lh – Atomic force microscopes / 78.30.-j – Infrared and Raman spectra / 73.20.Mf – Collective excitations
© EDP Sciences, 2007
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