Issue |
Eur. Phys. J. Appl. Phys.
Volume 40, Number 2, November 2007
|
|
---|---|---|
Page(s) | 163 - 167 | |
Section | Surfaces, Interfaces and Films | |
DOI | https://doi.org/10.1051/epjap:2007145 | |
Published online | 31 October 2007 |
https://doi.org/10.1051/epjap:2007145
Optimisation of the interface “organic material/aluminium” of CuPc/C60 based photovoltaic cells
1
Université de Nantes, Nantes Atlantique Universités, LAMP, EA
3825, Faculté des Sciences et des Techniques,
2 rue de la Houssinière, BP 92208, 44000 Nantes, France
2
Université de Badji-Mokhtar Annaba, Faculté des Sciences, Algeria
Corresponding author: jean-christian.bernede@univ-nantes.fr
Received:
2
April
2007
Accepted:
17
August
2007
Published online:
31
October
2007
We report the influence of an exciton-blocking layer and/or an Al2O3 thin layer at the interface “organic acceptor/aluminium” on the efficiency of CuPc/C60 based photovoltaic cells. The presence, or not, of a thin Al2O3 layer depends on the encapsulating process of the devices. In the case of glass/ITO/CuPc/C60/Al cells, the presence of an Al2O3 thin layer at the interface “organic acceptor/aluminium” increases strongly the open circuit voltage of the cells but decreases slightly their short circuit current and fill factor. In the case of glass/ITO/CuPc/C60/Alq3/Al cells, the open circuit voltage is systematically higher than without Alq3. However, in that case, the presence of Al2O3 does not improve significantly the cell performances. All these results are discussed in terms of series and shunt resistance values related to possible oxygen contamination and organic covalent action with the Al films. The effectiveness of these different phenomena depends on the presence, or not, of Alq3 and/or Al2O3 layers.
PACS: 73.40.-c – Electronic transport in interface structures / 73.50.Pz – Photoconduction and photovoltaic effects / 73.61.-r – Electrical properties of specific thin films / 81.15.Ef – Vacuum deposition
© EDP Sciences, 2007
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