Open Access
Eur. Phys. J. Appl. Phys.
Volume 61, Number 1, January 2013
Article Number 10102
Number of page(s) 4
Section Semiconductors and Devices
Published online 14 January 2013
  1. C. Youtsey, L.T. Romano, I. Adesida, Appl. Phys. Lett. 73, 797 (1998) [Google Scholar]
  2. H. Hasegawa, Y. Kamimura, K. Edagawa, I. Yonenaga, J. Appl. Phys. 102, 026103 (2007) [Google Scholar]
  3. I. Yonenaga, Y. Ohno, T. Taishi, Y. Tokumoto, H. Makino, T. Yao, Y. Kamimura, K. Edagawa, J. Cryst. Growth 318, 415 (2011) [Google Scholar]
  4. P.J. Hansen, Y.E. Strausser, A.N. Erickson, E.J. Tarsa, P. Kozodoy, E.G. Brazel, J.P. Ibbetson, U. Mishra, V. Narayanamurti, S.P. DenBaars, J.S. Speck, Appl. Phys. Lett. 72, 2247 (1998) [Google Scholar]
  5. D. Cherns, C.G. Jiao, Phys. Rev. Lett. 87, 205504 (2001) [CrossRef] [PubMed] [Google Scholar]
  6. J. Cai, F.A. Ponce, Phys. Stat. Sol. A 192, 407 (2002) [CrossRef] [Google Scholar]
  7. E. Müller, D. Gerthsen, P. Brückner, F. Scholz, Th. Gruber, A. Waag, Phys. Rev. B73, 245316 (2006) [Google Scholar]
  8. J.W.P. Hsu, M.J. Manfra, R.J. Molnar, B. Heying, J.S. Speck, Appl. Phys. Lett. 81, 79 (2002) [Google Scholar]
  9. B.S. Simpkins, E.T. Yu, P. Waltereit, J.S. Speck, J. Appl. Phys. 94, 1448 (2003) [Google Scholar]
  10. J. Spradlin, S. Dogan, J. Xie, R. Molnar, A.A. Baski, H. Morkoc, Appl. Phys. Lett. 84, 4150 (2004) [Google Scholar]
  11. H. Zhang, E.J. Miller, E.T. Yu, J. Appl. Phys. 99, 023703 (2006) [Google Scholar]
  12. P.K. Rao, B. Park, S.-T. Lee, Y.-K. Noh, M.-D. Kim, J.-E. Oh, J. Appl. Phys. 110, 013716 (2011) [Google Scholar]
  13. J.E. Northrup, Phys. Rev. B 66, 045204 (2002) [Google Scholar]
  14. Y. Kamimura, T. Yokoyama, H. Oiwa, K. Edagawa, I. Yonenaga, IOP Conf. Ser.: Mater. Sci. Eng. 3, 012010 (2009) [CrossRef] [Google Scholar]
  15. K. Motoki, T. Okahisa, N. Matsumoto, M. Matsushima, H. Kimura, H. Kasai, K. Takemoto, K. Uematsu, T. Hirano, M. Nakayama, S. Nakahata, M. Ueno, D. Hara, Y. Kumagai, A. Koukitu, H. Seki, Jpn J. Appl. Phys. Part 2 40, L140 (2001) [CrossRef] [Google Scholar]
  16. I. Yonenaga, K. Motoki, J. Appl. Phys. 90, 6539 (2001) [Google Scholar]
  17. I. Yonenaga, S. Itoh, T. Goto, Physica B 340–342, 484 (2003) [CrossRef] [Google Scholar]
  18. I. Yonenaga, H. Makino, S. Itoh, T. Goto, T. Yao, J. Electron. Mater. 35, 717 (2006) [CrossRef] [Google Scholar]
  19. C. Youtsey, I. Adesida, L.T. Romano, G. Bulman, Appl. Phys. Lett. 72, 560 (1998) [Google Scholar]
  20. T. Yokoyama, R. Takenaka, Y. Kamimura, K. Edagawa, I. Yonenaga, Appl. Phys. Lett. 95, 202108 (2009) [Google Scholar]
  21. A.F. Wright, U. Grossner, Appl. Phys. Lett. 73, 2751 (1998) [Google Scholar]
  22. S.M. Sze, Physics of Semiconductor Device, 2nd edn. (Wiley, New York, 1981) [Google Scholar]
  23. S. Amma, Y. Tokumoto, K. Edagawa, N. Shibata, T. Mizoguchi, T. Yamamoto, Y. Ikuhara, Appl. Phys. Lett. 96, 193109 (2010) [Google Scholar]

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