Eur. Phys. J. Appl. Phys.
Volume 61, Number 1, January 2013
|Number of page(s)||4|
|Section||Semiconductors and Devices|
|Published online||14 January 2013|
Local current conduction due to edge dislocations in deformed GaN studied by scanning spreading resistance microscopy
Institute of Industrial Science, The University of Tokyo, Komaba, Meguro-ku, Tokyo 153-8505, Japan
2 Institute for Materials Research, Tohoku University, Katahira, Sendai 980-8577, Japan
a e-mail: firstname.lastname@example.org
Revised: 12 November 2012
Accepted: 23 November 2012
Published online: 14 January 2013
Local electrical conductivities were measured for plastically deformed n-GaN single crystals by scanning spreading resistance microscopy (SSRM). In the SSRM images, many spots with high conductivity were observed, which can be attributed to introduced edge dislocations whose line direction is along [0 0 0 1] and Burgers vector is b = (a/3)[1 1 0]. This result is in contrast to the previous studies which showed that grown-in edge dislocations of the same type in GaN films exhibit virtually no conduction. This suggests that the dislocation conduction depends sensitively on the dislocation core structure. Current-voltage spectra indicated a Frenkel-Poole mechanism for the conduction.
© EDP Sciences, 2013
This article is distributed under the terms of the Creative Commons Attribution Noncommercial License which permits any noncommercial use, distribution, and reproduction in any medium, provided the original author(s) and source are credited.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.