| Issue |
Eur. Phys. J. Appl. Phys.
Volume 59, Number 1, July 2012
|
|
|---|---|---|
| Article Number | 10101 | |
| Number of page(s) | 7 | |
| Section | Semiconductors and Devices | |
| DOI | https://doi.org/10.1051/epjap/2012120184 | |
| Published online | 11 July 2012 | |
https://doi.org/10.1051/epjap/2012120184
Analysis of dielectric relaxation in glassy Se and Se98M2 (M = Ag, Cd and Sn) alloys
A study of metal-induced effects
Department of Physics, Banaras Hindu University, Varanasi 221005, India
a e-mail: dr_neeraj_mehta@yahoo.co.in
Received:
12
May
2012
Revised:
16
June
2012
Accepted:
19
June
2012
Published online:
11
July
2012
The present work reports the temperature and frequency dependence of dielectric constant (ε′) and dielectric loss (ε′′) in binary Se98M2 (Ag, Cd and Sn) alloys. The measurements have been made in the frequency range (1–500 kHz) and in the temperature range 297–345 K. The values of dielectric constant (ε′) and dielectric loss (ε′′) were found to decrease with frequency and increase with temperature. The maximum barrier height Wm is calculated from dielectric measurements according to the Guintini equation. The results indicate that the dielectric dispersion exists in the present glassy systems in the above frequency and temperature range.
© EDP Sciences, 2012
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