Open Access
Fig. 4
Download original image
XRD pattern of LaFeO3/Si thin films, indexed in the Pbnm settings. Peaks marked with an * can be indexed in the cubic perovskite phase. The small bump (♢) in the background around 2θ = 56° is due to the (311) planes of the silicon substrate.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.