| Issue |
Eur. Phys. J. Appl. Phys.
Volume 62, Number 2, May 2013
|
|
|---|---|---|
| Article Number | 20106 | |
| Number of page(s) | 7 | |
| Section | Semiconductors and Devices | |
| DOI | https://doi.org/10.1051/epjap/2013120463 | |
| Published online | 22 May 2013 | |
https://doi.org/10.1051/epjap/2013120463
Calorimetric study of thermal crystallization kinetics in Se78-xTe20Sn2Pbx (0 ≤ x ≤ 6) alloys
Department of Physics, Banaras Hindu University, Varanasi 221005, India
a e-mail: dr_neeraj_mehta@yahoo.co.in
Received:
12
October
2012
Accepted:
6
February
2013
Published online:
22
May
2013
Glassy samples of Se78−xTe20Sn2Pbx (0 ≤ x ≤ 6) system are prepared by melt quenching method. For non-isothermal study of crystallization kinetics, DSC scans have been taken at the heating rates 5, 10, 15 and 20 K/min in non-isothermal mode. Activation energy of crystallization (Ec) has been calculated using Kissinger method, Matusita-Sakka method and Augis-Bennett method. Various kinetic parameters of crystallization kinetics like peak crystallization temperature (Tc), Rate constants (K) and order parameter (n) are determined using these DSC scans. Thermodynamic parameters such as crystallization enthalpy (ΔHc) and entropy change during the crystallization (ΔS) are also evaluated. Results are discussed using chemical bond approach.
© EDP Sciences, 2013
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