| Issue |
Eur. Phys. J. Appl. Phys.
Volume 51, Number 3, September 2010
|
|
|---|---|---|
| Article Number | 30301 | |
| Number of page(s) | 5 | |
| Section | Semiconductors and Devices | |
| DOI | https://doi.org/10.1051/epjap/2010117 | |
| Published online | 02 September 2010 | |
https://doi.org/10.1051/epjap/2010117
Observation of Meyer Neldel rule and crystallization rate constant stability for Se93-xZn2Te5Inx chalcogenide glasses
Department of Physics Banaras Hindu University, Varanasi, 221005, India
Corresponding author: kedar_abhay@rediffmail.com
Received:
21
February
2010
Revised:
11
June
2010
Accepted:
14
June
2010
Published online:
2
September
2010
In present work we report that the observation of Meyer Neldel rule and crystallization rate constant stability of Se93-xZn2Te5Inx (0 ≤ x ≤ 10) chalcogenide glasses. A strong correlation has been observed between the pre-exponential factor (K0) and activation energy of crystallization (Ec). Such a strong correlation between K0 and Ec indicates that the presence of compensation effect under the non-isothermal crystallization processes. Further, obtained results also demonstrate that the crystallization rate constant stability is higher at 6 at.wt.% of indium.
© EDP Sciences, 2010
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