Eur. Phys. J. Appl. Phys.
Volume 31, Number 2, August 2005
|Page(s)||113 - 125|
|Section||Laser, Optics, Optoelectronics and Nanophotonics|
|Published online||18 August 2005|
Two-dimensional electromagnetic fluctuations in arbitrary geometries
Institute for Physics of Microstructures RAS,
603600 Nyzhny Novgorod, GSP-105, Russia
Corresponding author: email@example.com
Revised: 21 February 2005
Accepted: 15 April 2005
Published online: 18 August 2005
A general-purpose formulae for the nonretarded two-dimensional Green function in the case of arbitrary geometrical shapes of lossy dielectrics is derived by the method of complex variables. Spectral power densities of fluctuating electromagnetic fields are determined by real and imaginary parts of the Green function. Spectral properties of fluctuating fields in given geometrical domains may be obtained by appropriate conformal mappings. The applicability of the method is illustrated by in comparison with some exact solutions, in particular, related to a cylinder, to an arbitrary wedge, and to a plane slit. The impact of curved surfaces upon spectral characteristics is analyzed by numerical calculations of fields inside the “open” parabolic domain and inside or outside of “close” cylindrical domains as compare with a plane case. The controllability of spectral properties by a local curvature of surface is demonstrated.
PACS: 03.50.De – Classical electromagnetism, Maxwell equations / 05.40.-a – Fluctuation phenomena, random processes, noise, and Brownian motion / 12.20.-m – Quantum electrodynamics / 68.37.-d – Microscopy of surfaces, interfaces, and thin films
© EDP Sciences, 2005
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.