HTTP_Request2_Exception Unable to connect to tcp://cs.think.edpsciences.org:85. Error: Connection timed out Microscopic defects and homogeneity investigations in 4H-SiC epitaxial wafers by UV scanning photoluminescence spectroscopy | The European Physical Journal Applied Physics (EPJ AP)
Issue
Eur. Phys. J. Appl. Phys.
Volume 27, Number 1-3, July-September 2004
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
Page(s) 235 - 238
Section Defects in wide bandgap materials 1
DOI https://doi.org/10.1051/epjap:2004105
Published online 15 July 2004

© EDP Sciences, 2004

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