Eur. Phys. J. Appl. Phys.
Volume 26, Number 2, May 2004
|Page(s)||123 - 131|
|Section||Instrumentation and Metrology|
|Published online||07 April 2004|
High resolution microscopy techniques for the analysis of biological samples: a comparison
Dipartimento di Scienza dei Materiali and INFM, Università di Milano-Bicocca, Via Cozzi 53, 20126 Milano, Italy
2 Dipartimento di Fisica “G. Occhialini” and INFM, Università di Milano-Bicocca, Piazza della Scienza 3, 20126 Milano, Italy
3 Institute of Infectious and Tropical Diseases, University of Modena, Italy
4 Università di Milano, Milano, Italy
5 MPQ, Max Planck Institute für Quantenoptik, Garching, Germany
6 Royal Hallway College, University of London, UK
Corresponding author: email@example.com
Revised: 10 November 2003
Accepted: 11 December 2003
Published online: 7 April 2004
Performances and advantages of different high-resolution microscopy techniques are compared. These include Soft X-ray Contact Microscopy (SXCM), Atomic Force Microscopy (AFM), Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM). It is shown that they allow complementary approaches to imaging of biological objects. These techniques have been used to image the same type of cells (Saccharomyces cerevisiae) thus providing a common benchmark. In particular it is shown that the novel FIB technique allows easy target cell selection, fast operation, high resolution, 3D imaging and sample manipulation during imaging.
PACS: 79.20.Rf – Atomic, molecular, and ion beam impact and interactions with surfaces / 87.64.Dz – Scanning tunneling and atomic force microscopy / 87.64.Ee – Electron microscopy
© EDP Sciences, 2004
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