Eur. Phys. J. AP
Volume 21, Number 2, February 2003
|Page(s)||137 - 146|
|Section||Imaging, Microscopy and Spectroscopy|
|Published online||06 February 2003|
An experimental approach for dynamic investigation of the trapping properties of glass-ceramic under electron beam irradiation from a scanning electron microscope
LASSI/DTI UMR CNRS 6107, Faculté des Sciences, BP 1039, 51687 Reims Cedex 2, France
2 LaMaCop, Faculté des Sciences de Sfax, Route Soukra Km 3, BP 802, CP 3018 Sfax, Tunisia
3 UXL UMR CNRS 5818, Bât. A31-351, 33405 Talence Cedex, France
4 Department of Physics, Moscow State University, 119899 Moscow, Russia
Corresponding author: firstname.lastname@example.org
Accepted: 11 October 2002
Published online: 6 February 2003
A method is described that allows the trapping charge kinetics in insulating materials during their electron irradiation in a scanning electron microscope (SEM) to be studied and the total trapped charge to be evaluated. The method consists in analyzing the leakage and the displacement currents measured simultaneously, during and after irradiation, using an arrangement adapted to the SEM. The dynamic trapping properties of glass-ceramic are investigated and the time constants for charging and discharging processes are evaluated. By correlating the leakage and displacement currents, the total electron yield σ during irradiation is also determined.
PACS: 77.22.Jp – Dielectric breakdown and space-charge effects / 72.20.Jv – Charge carriers: generation, recombination, lifetime, and trapping / 79.20.Hx – Electron impact: secondary emission
© EDP Sciences, 2003
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