Open Access
| Issue |
Eur. Phys. J. Appl. Phys.
Volume 42, Number 3, June 2008
|
|
|---|---|---|
| Page(s) | 351 - 359 | |
| Section | Instrumentation and Metrology | |
| DOI | https://doi.org/10.1051/epjap:2008089 | |
| Published online | 04 June 2008 | |
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