| Issue |
Eur. Phys. J. Appl. Phys.
Volume 99, 2024
|
|
|---|---|---|
| Article Number | 21 | |
| Number of page(s) | 4 | |
| DOI | https://doi.org/10.1051/epjap/2024240087 | |
| Published online | 09 September 2024 | |
https://doi.org/10.1051/epjap/2024240087
Original Article
Characterisation of barium hexaferrite thin films in microwave frequency band
Hubert Curien Laboratory, Université Jean Monnet de Saint-Etienne, 25 rue Annino, Saint-Etienne 42000, France
* e-mail: didier.vincent@univ-st-etienne.fr
Received:
7
May
2024
Accepted:
24
July
2024
Published online: 9 September 2024
The characterization of barium hexaferrite thin-films at microwave frequencies is important for determining their electromagnetic properties by measuring the elements of the permeability tensor. Layers of 15 µm were deposited by RF sputtering on a coplanar line. As a result of this deposition and annealing technique, the magnetic moments are mainly oriented in the plane of the layer. By measuring the S parameters under magnetic field conditions, the µ and κ elements of the permeability tensor were extracted and their variations as a function of the applied field were highlighted. Possible applications to absorbent layers are being considered.
Key words: Characterization / microwave / magnetic materials / CPW
© D. Vincent, Published by EDP Sciences, 2024
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