Eur. Phys. J. Appl. Phys.
Volume 60, Number 1, October 2012
|Number of page(s)||6|
|Section||Semiconductors and Devices|
|Published online||05 November 2012|
In situ structural studies on orthorhombic SnS micro-crystals
Center for Nanoscience and Engineering, Indian Institute of Science, Bangalore 560012, India
2 Department of Aerospace Engineering, Indian Institute of Science, Bangalore 560012, India
3 Department of Physics, Indian Institute of Science, Bangalore 560012, India
4 Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore 560012, India
a e-mail: firstname.lastname@example.org
Revised: 13 September 2012
Accepted: 28 September 2012
Published online: 5 November 2012
In situ powder X-ray diffraction (XRD) studies on 3D micro-crystalline tin (II) sulfide (SnS) were carried out at different temperatures. While increasing temperature, the crystal structure of SnS remains stable as orthorhombic, whereas its lattice parameters and unit-cell volume are considerably varied. Further, these 3D micro-crystalline structures have showed a negative thermal expansion along the a-axis and positive expansion along the b- and c-axes. However, the overall drop along the a-axis of SnS crystals is nearly equal to their expansion along the c-axis. The observed changes in the structural properties of SnS micro-crystallites with temperature are discussed and reported.
© EDP Sciences, 2012
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