| Issue |
Eur. Phys. J. Appl. Phys.
Volume 60, Number 1, October 2012
|
|
|---|---|---|
| Article Number | 10102 | |
| Number of page(s) | 6 | |
| Section | Semiconductors and Devices | |
| DOI | https://doi.org/10.1051/epjap/2012120259 | |
| Published online | 05 November 2012 | |
https://doi.org/10.1051/epjap/2012120259
In situ structural studies on orthorhombic SnS micro-crystals
1
Center for Nanoscience and Engineering, Indian Institute of Science, Bangalore 560012, India
2
Department of Aerospace Engineering, Indian Institute of Science, Bangalore 560012, India
3
Department of Physics, Indian Institute of Science, Bangalore 560012, India
4
Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore 560012, India
a e-mail: dr_nkreddy@rediffmail.com
Received:
2
July
2012
Revised:
13
September
2012
Accepted:
28
September
2012
Published online:
5
November
2012
In situ powder X-ray diffraction (XRD) studies on 3D micro-crystalline tin (II) sulfide (SnS) were carried out at different temperatures. While increasing temperature, the crystal structure of SnS remains stable as orthorhombic, whereas its lattice parameters and unit-cell volume are considerably varied. Further, these 3D micro-crystalline structures have showed a negative thermal expansion along the a-axis and positive expansion along the b- and c-axes. However, the overall drop along the a-axis of SnS crystals is nearly equal to their expansion along the c-axis. The observed changes in the structural properties of SnS micro-crystallites with temperature are discussed and reported.
© EDP Sciences, 2012
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.