Eur. Phys. J. Appl. Phys.
Volume 54, Number 3, June 2011
Focus on Recent advances in (S)TEM and related spectroscopies: a tribute to C. Colliex
|Number of page(s)||4|
|Published online||09 June 2011|
Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM
Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba
a e-mail: firstname.lastname@example.org
Accepted: 8 March 2011
Published online: 9 June 2011
Imaging and chemical analysis of individual metallofullerene molecules were successfully carried out without massive destruction using a scanning transmission electron microscope (STEM) operated at 30 kV. Electron energy-loss spectroscopy (EELS) unambiguously identified the constituent atom of each metallofullerene molecule. The profile of EELS chemical map measured across the single atom provides a rough estimate of EELS signal delocalization, which is considerably reduced using accelerating voltage as low as 30 kV.
© EDP Sciences
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.