Issue |
Eur. Phys. J. Appl. Phys.
Volume 51, Number 1, July 2010
|
|
---|---|---|
Article Number | 10501 | |
Number of page(s) | 4 | |
Section | Thin Films | |
DOI | https://doi.org/10.1051/epjap/2010063 | |
Published online | 17 June 2010 |
https://doi.org/10.1051/epjap/2010063
Novel MgO/SiO2 double protective layers to prevent Ag mirror degradation
1
Image Architecture Lab, Semiconductor R&D center, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
2
AE group, Corporate Technology Operations SAIT, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
3
Advanced R&D group 3, Digital Printing Division, Samsung Electronics Co. Ltd., Suwon, 443-370, Republic of Korea
4
Department of Material Science & Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea
5
Department of Physics, College of Science and Technology, Yonsei University, Wonju, 220-710, Republic of Korea
Corresponding author: kihong21.kim@samsung.com
Received:
14
January
2010
Accepted:
31
March
2010
Published online:
17
June
2010
We demonstrate a very stable silver-coated mirror exploiting novel MgO/SiO2 double layers. It was found that the MgO/SiO2 protective layer provides a good adhesion and protection to the silver surface. Using epoxy-Ti(40 nm)-Ag(60 nm)-MgO(5~10 nm)-SiO2(25 nm) mirror structures, we achieved over 95% reflectivity and observed a minimal degradation in reflectance even after severe environmental tests.
© EDP Sciences, 2010
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.