| Issue |
Eur. Phys. J. Appl. Phys.
Volume 51, Number 1, July 2010
|
|
|---|---|---|
| Article Number | 10501 | |
| Number of page(s) | 4 | |
| Section | Thin Films | |
| DOI | https://doi.org/10.1051/epjap/2010063 | |
| Published online | 17 June 2010 | |
https://doi.org/10.1051/epjap/2010063
Novel MgO/SiO2 double protective layers to prevent Ag mirror degradation
1
Image Architecture Lab, Semiconductor R&D center, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
2
AE group, Corporate Technology Operations SAIT, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
3
Advanced R&D group 3, Digital Printing Division, Samsung Electronics Co. Ltd., Suwon, 443-370, Republic of Korea
4
Department of Material Science & Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea
5
Department of Physics, College of Science and Technology, Yonsei University, Wonju, 220-710, Republic of Korea
Corresponding author: kihong21.kim@samsung.com
Received:
14
January
2010
Accepted:
31
March
2010
Published online:
17
June
2010
We demonstrate a very stable silver-coated mirror exploiting novel MgO/SiO2 double layers. It was found that the MgO/SiO2 protective layer provides a good adhesion and protection to the silver surface. Using epoxy-Ti(40 nm)-Ag(60 nm)-MgO(5~10 nm)-SiO2(25 nm) mirror structures, we achieved over 95% reflectivity and observed a minimal degradation in reflectance even after severe environmental tests.
© EDP Sciences, 2010
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