Eur. Phys. J. Appl. Phys.
Volume 51, Number 1, July 2010
|Number of page(s)||7|
|Published online||17 June 2010|
Structural, optical and nanomechanical properties of (1 1 1) oriented nanocrystalline ZnTe thin films
Department of Materials Engineering, Indian Institute of Science, Bangalore, India
2 Advanced Centre of Research in High Energy Materials (ACRHEM), University of Hyderabad, Hyderabad, India
3 School of Physics, University of Hyderabad, Hyderabad, India
Corresponding author: firstname.lastname@example.org
Accepted: 3 May 2010
Published online: 17 June 2010
Structural, optical and nanomechanical properties of nanocrystalline Zinc Telluride (ZnTe) films of thickness upto 10 microns deposited at room temperature on borosilicate glass substrates are reported. X-ray diffraction patterns reveal that the films were preferentially oriented along the (1 1 1) direction. The maximum refractive index of the films was 2.74 at a wavelength of 2000 nm. The optical band gap showed strong thickness dependence. The average film hardness and Young's modulus obtained from load-displacement curves and analyzed by Oliver-Pharr method were 4 and 70 GPa respectively. Hardness of (1 1 1) oriented ZnTe thin films exhibited almost 5 times higher value than bulk. The studies show clearly that the hardness increases with decreasing indentation size, for indents between 30 and 300 nm in depth indicating the existence of indentation size effect. The coefficient of friction for these films as obtained from the nanoscratch test was ~0.4.
© EDP Sciences, 2010
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