Issue |
Eur. Phys. J. Appl. Phys.
Volume 48, Number 3, December 2009
|
|
---|---|---|
Article Number | 31201 | |
Number of page(s) | 4 | |
Section | Instrumentation and Metrology | |
DOI | https://doi.org/10.1051/epjap/2009185 | |
Published online | 04 November 2009 |
https://doi.org/10.1051/epjap/2009185
The measurements of total electron yield from silver*
1
College of Math and Physics, Nanjing University of Information and
Technology, Nanjing 210044, P.R. China
2
University of Science and Technology of China, P.O. Box 6022, Hefei 230029, P.R. China
Corresponding author: xag@126.com
Received:
23
April
2009
Revised:
27
August
2009
Accepted:
1
October
2009
Published online:
4
November
2009
A device for measuring total electron yields in the energy range 4–65 keV from conductor was set up successfully, which was made up of electron gun system, vacuum system and electrical system. By the pulse electron gun method, the total electron yields in the energy range 4–65 keV from silver were measured, based on the relation between the secondary electron yield and total electron yield at high incident electron energy from metals, the secondary electron yields in the energy range 10–65 keV from silver were deduced. Total electron yields measured with the device were compared with theoretical values, and the deduced secondary electron yield were compared with several authors' values, the results were discussed and a conclusion was drawn that the deduced secondary electron yields and the total electron yields from silver measured with the device are credible.
PACS: 14.60.Cd – Electrons (including positrons)
© EDP Sciences, 2009
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