| Issue |
Eur. Phys. J. Appl. Phys.
Volume 48, Number 3, December 2009
|
|
|---|---|---|
| Article Number | 31201 | |
| Number of page(s) | 4 | |
| Section | Instrumentation and Metrology | |
| DOI | https://doi.org/10.1051/epjap/2009185 | |
| Published online | 04 November 2009 | |
https://doi.org/10.1051/epjap/2009185
The measurements of total electron yield from silver*
1
College of Math and Physics, Nanjing University of Information and
Technology, Nanjing 210044, P.R. China
2
University of Science and Technology of China, P.O. Box 6022, Hefei 230029, P.R. China
Corresponding author: This email address is being protected from spambots. You need JavaScript enabled to view it.
Received:
23
April
2009
Revised:
27
August
2009
Accepted:
1
October
2009
Published online:
4
November
2009
Abstract
A device for measuring total electron yields in the energy range 4–65 keV from conductor was set up successfully, which was made up of electron gun system, vacuum system and electrical system. By the pulse electron gun method, the total electron yields in the energy range 4–65 keV from silver were measured, based on the relation between the secondary electron yield and total electron yield at high incident electron energy from metals, the secondary electron yields in the energy range 10–65 keV from silver were deduced. Total electron yields measured with the device were compared with theoretical values, and the deduced secondary electron yield were compared with several authors' values, the results were discussed and a conclusion was drawn that the deduced secondary electron yields and the total electron yields from silver measured with the device are credible.
PACS: 14.60.Cd – Electrons (including positrons)
This project was supported by the Science Foundation of Nanjing University of Information and Technology (Grant No. QD65).
© EDP Sciences, 2009
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.
