Eur. Phys. J. Appl. Phys.
Volume 60, Number 2, November 2012
|Number of page(s)||7|
|Section||Instrumentation and Metrology|
|Published online||05 November 2012|
A hemispherical retarding field energy analyzer to characterize spatially and angularly extended electron beams
ESA/ESTEC, Keplerlaan 1, 2209 AG Noordwijk, The Netherlands
2 LATMOS/IPSL, 4 avenue de Neptune, 94107 Saint-Maur-des-Fossés, France
a e-mail: firstname.lastname@example.org
Revised: 4 September 2012
Accepted: 9 October 2012
Published online: 5 November 2012
We have designed and built a hemispherical retarding field energy analyzer in order to facilitate characterization of large area electron emitters (typically field emitter arrays with active areas up to 1 cm2) with large angular aperture. A complete numerical model of the analyzer has been built, including perturbations due to secondary particles, in order to determine the analyzer performances. The analyzer energy resolution is better than 100 meV for an energy range up to 120 eV. The analyzer has a global field of view of 112° and allows measurements of the energy distribution of the beam as a function of the emission angle, as well as measurements of the beam intensity profile along any section of the beam. We have successfully used the analyzer to characterize the electron beam emitted by 1 cm2 Mo microtips-based field emitter arrays.
© EDP Sciences, 2012
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