Fine tuning of PEDOT electronic properties using solvents

Aristotle University of Thessaloniki, Physics Department, Lab for Thin Films-Nanosystems and Nanometrology, 54124 Thessaloniki, Greece

Corresponding author: cgrava@physics.auth.gr

Received: 20 October 2008
Accepted: 26 January 2009
Published online: 10 March 2009

Abstract

Non-destructive method of spectroscopic ellipsometry (SE) from IR to FUV was applied to study PEDOT/PSS thin films deposited by spin coating from aqueous dispersions of the material with different N,N-Dimethylformamide (DMF) volume percent. In our work we used the Tauc-Lorentz model to describe the dielectric function of PEDOT/PSS:DMF films in the Vis-FUV energy region. First, the spectrum analysis showed that the thickness and the fundamental band gap E_g of the film is being decreased with the increase of DMF content in the dispersion. Taking into account that the heating temperature is below the boiling point of DMF we assume that DMF molecules are incorporated in the film volume and act as dopants. Further more, this means that carrier concentration is being increased and thus we have higher electrical conductivity. The existence of DMF molecules in the film proved from FTIR SE, which can probe the bonding structure of the materials. The results showed lowering of peak intensity assigned to PEDOT/PSS and appearing of peaks assigned to DMF in the imaginary part of spectrum. In conclusion, SE is a potential tool for the evaluation of electronic properties for conductive polymers.