| Issue |
Eur. Phys. J. Appl. Phys.
Volume 45, Number 1, January 2009
|
|
|---|---|---|
| Article Number | 10303 | |
| Number of page(s) | 3 | |
| Section | Semiconductors and Devices | |
| DOI | https://doi.org/10.1051/epjap:2008202 | |
| Published online | 14 January 2009 | |
https://doi.org/10.1051/epjap:2008202
Shot noise in macroscopic CdTe resistors: experimental evidence and analytical study
HIRLA, Department of Optoelectronics, Damascus University, Syria
Corresponding author: imad.asaad@contact.asso.fr
Received:
21
September
2008
Accepted:
5
November
2008
Published online:
14
January
2009
In this work, we present experimental evidence and analytical studies of
dark current noise spectral density in CdTe detectors for a low and mid
frequency range. The measured noise level in CdTe detectors indicates shot
noise suppression at 10 KHz; this suppression can occur in CdTe detectors
when the diffusion time is greater than the transit time between electrodes.
Moreover we show thermal noise is negligible in CdTe resistors, taking into
account their high resistance: R # 150 G
.
PACS: 42.50.Lc – Quantum fluctuations, quantum noise, and quantum jumps
© EDP Sciences, 2008
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