Eur. Phys. J. Appl. Phys.
Volume 45, Number 1, January 2009
|Number of page(s)||3|
|Section||Semiconductors and Devices|
|Published online||14 January 2009|
Shot noise in macroscopic CdTe resistors: experimental evidence and analytical study
HIRLA, Department of Optoelectronics, Damascus University, Syria
Corresponding author: firstname.lastname@example.org
Accepted: 5 November 2008
Published online: 14 January 2009
In this work, we present experimental evidence and analytical studies of dark current noise spectral density in CdTe detectors for a low and mid frequency range. The measured noise level in CdTe detectors indicates shot noise suppression at 10 KHz; this suppression can occur in CdTe detectors when the diffusion time is greater than the transit time between electrodes. Moreover we show thermal noise is negligible in CdTe resistors, taking into account their high resistance: R # 150 G.
PACS: 42.50.Lc – Quantum fluctuations, quantum noise, and quantum jumps
© EDP Sciences, 2008
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