| Issue |
Eur. Phys. J. Appl. Phys.
Volume 36, Number 3, December 2006
|
|
|---|---|---|
| Page(s) | 281 - 283 | |
| Section | Characterization of Materials: Imaging, Microscopy and Spectroscopy | |
| DOI | https://doi.org/10.1051/epjap:2006140 | |
| Published online | 06 December 2006 | |
https://doi.org/10.1051/epjap:2006140
Highly sensitive spectroscopic characterization of inorganic and organic heterojunctions for solar cells*
1
Institute for Materials Research, Hasselt University, and IMEC, Division IMOMEC, Wetenschapspark 1, 3590 Diepenbeek, Belgium
2
Laboratoire de Chimie des Polymères, Université libre de Bruxelles, Campus de la Plaine, CP206/01,
boulevard du Triomphe, 1050 Bruxelles, Belgium
Corresponding author: koen.vandewal@uhasselt.be
Received:
25
July
2006
Accepted:
28
September
2006
Published online:
6
December
2006
Sub-bandgap absorption features (
cm−1) have been detected in organic and inorganic semiconductors and their heterojunctions. Photothermal deflection spectroscopy (PDS) is used to increase the detection limit considerably with respect to common absorption spectroscopy. Results are presented on discotic liquid crystals, donor-acceptor complex formation in P3HT:PCBM solar cells and UV-induced defect generation in nanoporous 
.
PACS: 78.20.-e – Optical properties of bulk materials and thin films / 78.40.Me – Organic compounds and polymers / 78.55.Mb – Porous materials
© EDP Sciences, 2006
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