Eur. Phys. J. Appl. Phys.
Volume 35, Number 1, July 2006
|Page(s)||49 - 55|
|Section||Characterization of Materials: Imaging, Microscopy and Spectroscopy|
|Published online||23 June 2006|
Dielectric, relaxor and ferroelectric characterization of La doped xPb(Mg1/3Nb2/3)O3-(1 − x)Pb(Zr0.55Ti0.45)O3 ceramics
Departmento de Ingeneria de Materials, (DIMAT), Facultad de Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C, Concepcion, Chile
Corresponding author: email@example.com
Revised: 11 March 2006
Accepted: 7 April 2006
Published online: 23 June 2006
The relaxor ferroelectric ceramics of La doped xPb(Mg1/3Nb2/3)O3-(1 − x)Pb(Zr0.55Ti0.45)O3 are synthesized by columbite precursor method. Powder X-ray diffraction patterns of these compositions indicate pseudocubic phase formation. Grain growth is inhibited with La doping and is increased with PMN concentration in PMN-PZT ceramics. and tan δ are increased to 1.5 mole% La doped PMN-PZT compositions while and TC are decreased with La modification in PMN-PZT system. Pure and La modified 0.8PMN-0.2PZT compositions have shown the most promising relaxor behavior useful for multilayer capacitor (MLC) applications. The ferroelectric properties (Ec, Pr and Ps) are increased to 1.5 mole% La doped PMN-PZT composition. 77.84.Dy Niobates, titanates, tantalates, PZT ceramics, etc.
PACS: 77.84.-s – Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials / 77.22.Gm – Dielectric loss and relaxation / 68.37.Hk – Scanning electron microscopy (SEM)
© EDP Sciences, 2006
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