| Issue |
Eur. Phys. J. Appl. Phys.
Volume 35, Number 1, July 2006
|
|
|---|---|---|
| Page(s) | 49 - 55 | |
| Section | Characterization of Materials: Imaging, Microscopy and Spectroscopy | |
| DOI | https://doi.org/10.1051/epjap:2006066 | |
| Published online | 23 June 2006 | |
https://doi.org/10.1051/epjap:2006066
Dielectric, relaxor and ferroelectric characterization of La doped xPb(Mg1/3Nb2/3)O3-(1 − x)Pb(Zr0.55Ti0.45)O3 ceramics
Departmento de Ingeneria de Materials, (DIMAT), Facultad de Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C, Concepcion, Chile
Corresponding author: ramamk@udec.cl
Received:
24
October
2005
Revised:
11
March
2006
Accepted:
7
April
2006
Published online:
23
June
2006
The relaxor ferroelectric ceramics of La doped xPb(Mg1/3Nb2/3)O3-(1 − x)Pb(Zr0.55Ti0.45)O3 are
synthesized by columbite precursor method. Powder X-ray diffraction patterns
of these compositions indicate pseudocubic phase formation. Grain growth is
inhibited with La doping and is increased with PMN concentration in PMN-PZT
ceramics. 
and tan δ are increased to 1.5 mole% La doped PMN-PZT compositions while 
and TC are decreased with La modification in PMN-PZT system. Pure and La modified 0.8PMN-0.2PZT compositions have shown the most promising relaxor
behavior useful for multilayer capacitor (MLC) applications. The
ferroelectric properties (Ec, Pr and Ps) are increased to 1.5 mole% La doped PMN-PZT composition.
77.84.Dy Niobates, titanates, tantalates, PZT ceramics, etc.
PACS: 77.84.-s – Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials / 77.22.Gm – Dielectric loss and relaxation / 68.37.Hk – Scanning electron microscopy (SEM)
© EDP Sciences, 2006
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