Eur. Phys. J. Appl. Phys.
Volume 35, Number 1, July 2006
|Page(s)||43 - 47|
|Section||Characterization of Materials: Imaging, Microscopy and Spectroscopy|
|Published online||23 June 2006|
Microstructure, dielectric and ferroelectric characterization of Ba doped PLZT ceramics
Departmento de Ingeneria de Materials, (DIMAT), Facultad de
Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C,
Corresponding author: firstname.lastname@example.org
Revised: 8 March 2006
Accepted: 7 April 2006
Published online: 23 June 2006
Ba doped PLZT ceramic compositions with formula Pb0.982−zLa0.012Δ0.006Baz(Zr0.55Ti0.45)O3 for z = 0 to 6 mole% are synthesized by mixed-oxide method. Powder XRD studies indicate the coexistence of rhombohedral and tetragonal phase in 5 mole% Ba doped PLZT composition. SEM pictures show grain size control as Ba concentration increases in PLZT system. and tan δ are increased up to 4 mole% and 5 mole% Ba doped PLZT composition respectively. Dielectric maximum () is decreased to 4 mole% Ba doped PLZT and Curie temperature (TC) is decreased with increase of Ba concentration in PLZT system. Coercive field (Ec) has shown gradual enhancement over series. Remanent (Pr) and spontaneous (Ps) polarizations are decreased to 5 mole% Ba doped PLZT composition.
PACS: 77.84.-s – Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials / 77.22.Gm – Dielectric loss and relaxation / 68.37.Hk – Scanning electron microscopy (SEM) / 77.84.Dy – Niobates, titanates, tantalates, PZT ceramics, etc.
© EDP Sciences, 2006
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