Issue |
Eur. Phys. J. Appl. Phys.
Volume 35, Number 1, July 2006
|
|
---|---|---|
Page(s) | 43 - 47 | |
Section | Characterization of Materials: Imaging, Microscopy and Spectroscopy | |
DOI | https://doi.org/10.1051/epjap:2006065 | |
Published online | 23 June 2006 |
https://doi.org/10.1051/epjap:2006065
Microstructure, dielectric and ferroelectric characterization of Ba doped PLZT ceramics
Departmento de Ingeneria de Materials, (DIMAT), Facultad de
Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C,
Concepcion, Chile
Corresponding author: ramamk@udec.cl
Received:
24
October
2005
Revised:
8
March
2006
Accepted:
7
April
2006
Published online:
23
June
2006
Ba doped PLZT ceramic compositions with formula
Pb0.982−zLa0.012Δ0.006Baz(Zr0.55Ti0.45)O3 for z = 0 to 6 mole%
are synthesized by mixed-oxide method. Powder XRD studies indicate the
coexistence of rhombohedral and tetragonal phase in 5 mole% Ba doped PLZT
composition. SEM pictures show grain size control as Ba concentration
increases in PLZT system. and tan δ are
increased up to 4 mole% and 5 mole% Ba doped PLZT composition
respectively. Dielectric maximum (
) is decreased to 4
mole% Ba doped PLZT and Curie temperature (TC) is decreased with
increase of Ba concentration in PLZT system. Coercive field (Ec) has
shown gradual enhancement over series. Remanent (Pr) and spontaneous
(Ps) polarizations are decreased to 5 mole% Ba doped PLZT
composition.
PACS: 77.84.-s – Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials / 77.22.Gm – Dielectric loss and relaxation / 68.37.Hk – Scanning electron microscopy (SEM) / 77.84.Dy – Niobates, titanates, tantalates, PZT ceramics, etc.
© EDP Sciences, 2006
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