Eur. Phys. J. Appl. Phys.
Volume 33, Number 1, January 2006
|Page(s)||51 - 57|
|Section||Instrumentation and Metrology|
|Published online||06 December 2005|
Noise and response characterization of an anisotropic magnetoresistive sensor working in a high-frequency flipping regime
Dipartimento di Fisica, Università di Trento, 38050 Trento-Povo, Italy
2 Dipartimento di Fisica, Università di Siena, 53100 Siena, Italy
3 NeuriCam S.p.A., Via S. Maria Maddalena, 12, 38100 Trento, Italy
Corresponding author: firstname.lastname@example.org
Revised: 2 August 2005
Accepted: 29 September 2005
Published online: 6 December 2005
We report on the characterization of the behaviour of an anisotropic magnetoresistive sensor undergoing a 100 kHz flipping of the magnetic domains, i.e. at frequencies two/three orders of magnitude higher than conventionally recommended. The noise analysis allows for the optimal setting of the relevant parameters defining such high-frequency, and hitherto unexplored, operation regime. Precision and accuracy performance in static conditions have been assessed by keeping into account the role of the sensor temperature. This last parameter has been evaluated by suitably manipulating the signals occurring at the sensor itself. The used technique can provide the base for a temperature sensor conditioning to be employed in magnetometers using this kind of devices.
PACS: 07.07.Df – Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing / 73.43.Qt – Magnetoresistance / 85.70.Kh – Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc.
© EDP Sciences, 2006
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.