| Issue |
Eur. Phys. J. Appl. Phys.
Volume 24, Number 3, December 2003
|
|
|---|---|---|
| Page(s) | 215 - 221 | |
| Section | Imaging, Microscopy and Spectroscopy | |
| DOI | https://doi.org/10.1051/epjap:2003071 | |
| Published online | 03 October 2003 | |
https://doi.org/10.1051/epjap:2003071
Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction
1
Unité Mixte de Physique CNRS/Thales, 91404 Orsay,
France
2
Laboratoire de Physique des Solides, Université
Paris-Sud, 91405 Orsay, France
3
UMR-S INSERM 514 and LERI,
University of Reims, 51092 Reims Cedex, France
Corresponding author: jean-luc.maurice@thalesgroup.com
Received:
18
February
2003
Revised:
22
May
2003
Accepted:
11
July
2003
Published online:
3
October
2003
We use High Resolution Electron Microscopy (HRTEM) together with Electron Energy Loss Spectroscopy (EELS) to analyze the crystallography and the chemical configuration of interfaces in a state-of-the-art La2/3Sr1/3MnO3/SrTiO3/La2/3Sr1/3MnO3 tunnel junction. EELS indicates that manganese ions keep their bulk valency up to the last atomic plane in contact with the insulator. Tunnel magnetoresistance however decreases with temperature faster than magnetisation in these samples. Quantitative HRTEM reveals some local departures from chemical abruptness at the interfaces, which could play a role in this decrease.
PACS: 75.47.Lx – Manganites / 75.70.Cn – Magnetic properties of interfaces (multilayers, superlattices, heterostructures) / 68.37.Lp – Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.)
© EDP Sciences, 2003
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