Eur. Phys. J. Appl. Phys.
Volume 24, Number 3, December 2003
|Page(s)||215 - 221|
|Section||Imaging, Microscopy and Spectroscopy|
|Published online||03 October 2003|
Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction
Unité Mixte de Physique CNRS/Thales, 91404 Orsay,
2 Laboratoire de Physique des Solides, Université Paris-Sud, 91405 Orsay, France
3 UMR-S INSERM 514 and LERI, University of Reims, 51092 Reims Cedex, France
Corresponding author: firstname.lastname@example.org
Revised: 22 May 2003
Accepted: 11 July 2003
Published online: 3 October 2003
We use High Resolution Electron Microscopy (HRTEM) together with Electron Energy Loss Spectroscopy (EELS) to analyze the crystallography and the chemical configuration of interfaces in a state-of-the-art La2/3Sr1/3MnO3/SrTiO3/La2/3Sr1/3MnO3 tunnel junction. EELS indicates that manganese ions keep their bulk valency up to the last atomic plane in contact with the insulator. Tunnel magnetoresistance however decreases with temperature faster than magnetisation in these samples. Quantitative HRTEM reveals some local departures from chemical abruptness at the interfaces, which could play a role in this decrease.
PACS: 75.47.Lx – Manganites / 75.70.Cn – Magnetic properties of interfaces (multilayers, superlattices, heterostructures) / 68.37.Lp – Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.)
© EDP Sciences, 2003
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