High frequency model of stacked film capacitors

Laboratoire d'Électrotechnique de Montpellier, Université de Montpellier II, place Eugène Bataillon, CC 079, 34095 Montpellier Cedex 5, France

Corresponding authors: talbert@crit.univ-montp2.fr joubert@crit.univ-montp2.fr daude@crit.univ-montp2.fr glaize@crit.univ-montp2.fr

Received: 7 September 2000
Revised: 5 July 2001
Accepted: 5 July 2001
Published online: 15 November 2001

Abstract

Polypropylene metallized capacitors are of general use in power electronics because of their reliability, their self-healing capabilities, and their low price. Though the behavior of metallized coiled capacitors has been discussed, no work has been carried out on stacked and flattened metallized capacitors. The purpose of this article is to suggest an analytical model of resonance frequency, stray inductance and impedance of stacked capacitors. We first solve the equation of propagation of the magnetic potential vector (A) in the dielectric of an homogeneous material. Then, we suggest an original method of resolution, like the one used for resonant cavities, in order to present an analytical solution of the problem. Finally, we give some experimental results proving that the physical knowledge of the parameters of the capacitor (dimension of the component, and material constants), enables us to calculate an analytical model of resonance frequency, stray inductance and impedance of stacked capacitors.