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Cited article:

Reliability of Power Semiconductor Modules: A State-of-the-Art Review

Eneko Agirrezabala, Iosu Aizpuru, David Garrido and Ane Portillo
IEEE Open Journal of Power Electronics 6 1036 (2025)
https://doi.org/10.1109/OJPEL.2025.3576994

Effect of Thermal Oxidative Aging on Cross-Linking Network and Electrical Property of Silicone Gel for IGBT Packaging

Fuping Zeng, Dazhi Su, Rirong Chen, Qiang Yao, Long Li and Ju Tang
IEEE Transactions on Dielectrics and Electrical Insulation 31 (2) 1012 (2024)
https://doi.org/10.1109/TDEI.2023.3345259

Soft sensor design for estimation of thermal behavior of encapsulating materials in power electronic module

B. Trajin, I. Sakhraoui and F. Rotella
Microelectronics Reliability 126 114254 (2021)
https://doi.org/10.1016/j.microrel.2021.114254