Issue |
Eur. Phys. J. Appl. Phys.
Volume 94, Number 1, April 2021
|
|
---|---|---|
Article Number | 10101 | |
Number of page(s) | 7 | |
Section | Semiconductors and Devices | |
DOI | https://doi.org/10.1051/epjap/2021210015 | |
Published online | 12 April 2021 |
- International Energy agency − IEA, Renewable Power, Paris, 2020 [Google Scholar]
- Fraunhofer Institute for Solar Energy Systems ISE, Photovoltaics Report, Freiburg, 2020 [Google Scholar]
- J.R. Davis, A. Rohatgi, R.H. Hopkins, P.D. Blais, P. Rai-Choudhury, J.R. McCormick, H.C. Mollenkopf, IEEE Trans. Electron Devices 27, 677 (1980) [Google Scholar]
- J. Schmidt, B. Lim, D. Walter, K. Bothe, S. Gatz, T. Dullweber, P.P. Altermatt, IEEE J. Photovoltaics 3, 114 (2013) [Google Scholar]
- H. Savin, M. Yli-Koski, A. Haarahiltunen, Appl. Phys. Lett. 95, 15 (2009) [Google Scholar]
- A. Inglese, A. Focareta, F. Schindler, J. Schön, J. Lindroos, M.C. Schubert, H. Savin, Energy Procedia 92, 808 (2016) [Google Scholar]
- K. Graff, Metal Impurities in Silicon-Device Fabrication (Springer Science, Berlin, 2013) [Google Scholar]
- A.A. Istratov, E.R. Weber, Appl. Phys. A 66, 123 (1998) [Google Scholar]
- J. Lindroos, D.P. Fenning, D.J. Backlund, E. Verlage, A. Gorgulla, S.K. Estreicher, H. Savin, T. Buonassisi, J. Appl. Phys. 113, 204906 (2013) [Google Scholar]
- E.R. Weber, Appl. Phys. A Solids Surfaces 30, 1 (1983) [Google Scholar]
- T. Hosoya, Y. Ozaki, K. Hirata, J. Electrochem. Soc. 132, 2436 (1985) [Google Scholar]
- A. Inglese, J. Lindroos, H. Vahlman, H. Savin, J. Appl. Phys. 120, (2016) [Google Scholar]
- B.B. Paudyal, K.R. McIntosh, D.H. MacDonald, G. Coletti, J. Appl. Phys. 107, 2 (2010) [Google Scholar]
- A.E. Morishige, M.A. Jensen, D.B. Needleman, K. Nakayashiki, J. Hofstetter, T.T.A. Li, T. Buonassisi, 2017 IEEE 44th Photovolt. Spec. Conf. PVSC 2017, 1 (2017) [Google Scholar]
- S. Rein, S.W. Glunz, Appl. Phys. Lett. 82, 1054 (2003) [Google Scholar]
- C. Sun, F.E. Rougieux, D. Macdonald, J. Appl. Phys. 115, (2014) [Google Scholar]
- W. Shockley, W.T. Read, Phys. Rev. 87, 835 (1952) [CrossRef] [Google Scholar]
- R.N. Hall, Phys. Rev. 87, 387 (1952) [Google Scholar]
- A. Hangleiter, Phys. Rev. B 37, 2594 (1988) [Google Scholar]
- D.V. Lang, C.H. Henry, Phys. Rev. B 15, 989 (1977) [Google Scholar]
- F.E. Rougieux, C. Sun, D. Macdonald, Sol. Energy Mater. Sol. Cells 187, 263 (2018) [Google Scholar]
- A. Hangleiter, Phys. Rev. B 35, 9149 (1987) [Google Scholar]
- M.A. Green, J. Appl. Phys. 67, 2944 (1990) [CrossRef] [Google Scholar]
- J.E. Lang, F.L. Madarasz, P.M. Hemenger, J. Appl. Phys. 54, 3612 (1983) [CrossRef] [Google Scholar]
- S.M. Sze, K.K. Ng, Physics of Semiconductor Devices , 3rd edn. (Wiley, NJ, 2007) [Google Scholar]
- S. Rein, Lifetime Spectroscopy (Springer-Verlag, Berlin/Heidelberg, 2005) [Google Scholar]
- J. Utzig, W. Schröter, Appl. Phys. Lett. 45, 761 (1984) [Google Scholar]
- E.A. Taft, F.H. Horn, Phys. Rev. 93, 64 (1954) [Google Scholar]
- C.B. Collins, R.O. Carlson, C.J. Gallagher, Phys. Rev. 105, 1168 (1957) [Google Scholar]
- R.H. Wu, A.R. Peaker, Solid-State Electron. 25, 643 (1982) [Google Scholar]
- G. Bemski, Phys. Rev. 111, 1515 (1958) [Google Scholar]
- C.C. Abbas, IEEE Trans. Electron Devices 31, 1428 (1984) [Google Scholar]
- K. Watanabe, C. Munakata, Semicond. Sci. Technol. 8, 230 (1993) [Google Scholar]
- B.B. Paudyal, K.R. McIntosh, D.H. MacDonald, in 34th IEEE Photovolt. Spec. Conf. (IEE, Philadelphia, 2009), p. 001588 [Google Scholar]
- A.C. Wang, C.T. Sah, J. Appl. Phys. 56, 1021 (1984) [Google Scholar]
- O. Palais, J. Gervais, E. Yakimov, S. Martinuzzi, Opt. Mater. (Amst). 162, 157 (2000) [Google Scholar]
- O. Palais, Solid State Phenom. 79, 267 (2001) [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.