From early to present and future achievements of EELS in the TEM | The European Physical Journal Applied Physics (EPJ AP)

Special lssue on ‘EELS - Review over the last 50 years by Christian Colliex’

Open Access

Fig. 21

(a) Experimental variation of the Si/SiO₂ interface plasmon (IPl) peak profile when the position of the e-beam with respect to the interface (x₀) is varied from Si (x₀ < 0) into SiO₂ (x₀ > 0); (b) Theoretical calculations in the non-relativistic and in the relativistic case (R) for different probe positions (x₀ = –1, 2 and 5 nm), from [101].

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