Open Access

Table 2

Atomic percentages of oxygen, carbon and nitrogen determined by XPS analysis prior to and after activation.

  Device power %O %C %N
PEEK theoretic / 13.6 83.4
PEEK reference / 13.5 85.8 0.2
Air plasma 800 W 19 79.9 0.4
900 W 20.2 79.1 0.4
950 W 21.9 76.5 0.8
1320 W 21.5 77.1 0.9
Nitrogen plasma 1120 W 19.6 79.2 0.9
1180 W 20.4 78.3 0.7
1230 W 20.3 78.5 0.8
1530 W 21.9 77 0.7

All measures are given with a standard deviation of 0.1%.

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