Regular Article

Correlation between structural and morphological properties of multilayer perovskite ZnTiO₃ coated porous silicon

¹ Groupe de Recherche des Semi-conducteurs, des Nanostructures et des Technologies Avancées (SNTA), Laboratoire de Photovoltaïque (LPV), Centre de Recherches et des Technologies de l'Energie (CRTEn) Borj Cedria B.P N°95 2050, Hammam Lif, Tunisia
² Faculty of Mathematical, Physical and Natural Sciences of Tunis, University of Tunis, El Manar, Tunisia
³ Institute of Catalysis and Petrochemical, CSIC, Marie Curie, 2, Cantoblanco, Madrid 28049, Spain

^* e-mail: khalifa_marouan@yahoo.fr

Received: 20 January 2021
Received in final form: 31 March 2021
Accepted: 28 April 2021
Published online: 21 June 2021

Abstract

This work reports on correlation between structural and morphological properties of ZnTiO₃/porous silicon (PS). The PS was elaborated by electrochemical anodization from the single- crystal p-type silicon wafer. Nanocrystalline ZnTiO₃ thinfilms have been prepared on PS using sol-gels pin coating technique. The deposited films were annealed in air at 800 °C for 2 h. The structural and morphological properties of the films were studied for different number of layers. X-ray diffraction spectra confirms that ZnTiO₃ films were hexagonal phase and the crystallite size of ZnTiO₃ films increased from 111 to 125 nm when the number of layers increase from 4 to 8 layers. SEM image shows approximate semi-spherical particles with a little agglomeration for all samples. The morphologies changed and the average grain size changed and increases from 81nm to 131nm.