Regular Article

Negative group delay experimentation with tee connector and cable structures

¹ Nanjing University of Information Science & Technology, Nanjing, China
² Amity University Haryana, Gurgaon, 122413 India
³ Université Clermont Auvergne, Institut Pascal, SIGMA Clermont, 4 av Blaise Pascal, 63178 Aubière, France

^* e-mail: blaise.ravelo@yahoo.fr

Received: 23 January 2020
Received in final form: 11 May 2020
Accepted: 8 June 2020
Published online: 30 July 2020

Abstract

The unfamiliar negative group-delay (NGD) phenomenon is experimented with structure constituted by tee-connectors and coaxial cables. The topology of the NGD generator is described. It consists of two parallel 50-Ω characteristic impedance cables. The S-parameter model in function of the cable physical lengths is established. The existence condition enabling to understand the NGD phenomenon is defined. A proof of concept simply is constituted by two three-port SMA connectors, three SMA transitions and 13-cm length cables. The NGD experimentation is performed from 1.5 GHz to 3.5 GHz. Tri-band NGD aspects in good agreement with the theory and simulation is observed experimentally. Particularly, high figure-of-merit NGD circuit with −3 ns NGD level, less than 2 dB insertion loss and 12 dB return loss around 3 GHz centre frequency is measured.