Eur. Phys. J. Appl. Phys.
Volume 65, Number 3, March 2014
|Number of page(s)||5|
|Published online||07 March 2014|
Nanomechanical behavior of (1 0 0) oriented titanium thin films
School of Physics, University of Hyderabad, Hyderabad
500 046, India
2 Centre for Nanotechnology, University of Hyderabad, Hyderabad 500 046, India
3 School of Engineering Sciences and Technology, University of Hyderabad, Hyderabad 500 046, India
a e-mail: email@example.com
Revised: 1 February 2014
Accepted: 4 February 2014
Published online: 7 March 2014
Titanium thin films were deposited on single crystal Si (3 1 1) and polycrystalline 316 LN nuclear grade stainless steel substrates by RF magnetron sputtering. X-ray diffraction revealed that, irrespective of substrate type, films exhibit preferential growth along the (1 0 0) plane. The microstructure of the films corresponds to the zone-I type in structure zone model on both substrates. The hardness and Young's modulus of the films were extracted from load-displacement curves. The maximum values of hardness and Young's modulus were 12 and 132 GPa respectively for 220 nm thin film on SS substrate. The electrical resistivity data revealed that the films are metallic in nature and the resistivity is lower in the case of the 220 nm thickness film, on both substrates. The observed changes in mechanical and electrical properties can be correlated with variations in the microstructure of Ti films.
© EDP Sciences, 2014
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.