Eur. Phys. J. Appl. Phys.
Volume 64, Number 3, December 2013
|Number of page(s)||4|
|Section||Instrumentation and Metrology|
|Published online||09 December 2013|
In situ break-junction sample holder for transmission electron microscopy
Laboratoire de Physique des Solides, CNRS, UMR 8502 Université Paris Sud, 91405 Orsay, France
2 Service de Physique de l’Etat Condensé, URA CNRS 2464 CEA/DSM/IRAMIS/SPEC Orme des Merisiers, 91191 Gif-sur-Yvette, France
a e-mail: firstname.lastname@example.org
Revised: 2 October 2013
Accepted: 18 October 2013
Published online: 9 December 2013
In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instrumentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.
© EDP Sciences, 2013
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.