Eur. Phys. J. Appl. Phys.
Volume 64, Number 3, December 2013
|Number of page(s)||4|
|Section||Instrumentation and Metrology|
|Published online||09 December 2013|
In situ break-junction sample holder for transmission electron microscopy
Laboratoire de Physique des Solides, CNRS, UMR 8502 Université Paris Sud, 91405 Orsay, France
2 Service de Physique de l’Etat Condensé, URA CNRS 2464 CEA/DSM/IRAMIS/SPEC Orme des Merisiers, 91191 Gif-sur-Yvette, France
a e-mail: email@example.com
Revised: 2 October 2013
Accepted: 18 October 2013
Published online: 9 December 2013
In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instrumentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.
© EDP Sciences, 2013
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