Issue |
Eur. Phys. J. Appl. Phys.
Volume 64, Number 3, December 2013
|
|
---|---|---|
Article Number | 30304 | |
Number of page(s) | 7 | |
Section | Thin Films | |
DOI | https://doi.org/10.1051/epjap/2013130302 | |
Published online | 09 December 2013 |
https://doi.org/10.1051/epjap/2013130302
Effect of deposition time on the Cd0.8Zn0.2S thin films
Department of Physics, Shahid Beheshti University, Tehran, Iran
a e-mail: somayeh tohidi@yahoo.com
Received:
26
June
2013
Revised:
10
September
2013
Accepted:
12
November
2013
Published online:
9
December
2013
Nanocrystalline Cd0.8Zn0.2S thin films were prepared by chemical-bath-deposited method and the effect of time on the properties of Cd0.8Zn0.2S thin films was studied. The X-ray diffraction (XRD) patterns show that the synthesized films have a cubical (zinc blende) phase. The mean crystallite size and the internal lattice strain were calculated. Atomic force microscopy (AFM) studies showed that the surface roughness of the films increase with increasing thickness. The optical constants of Cd0.8Zn0.2S films were determined and the analysis of the result showed that Cd0.8Zn0.2S thin films have direct transition and the values of energy gap indicates quantum confinement effect.
© EDP Sciences, 2013
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