Eur. Phys. J. Appl. Phys.
Volume 64, Number 2, November 2013
|Number of page(s)||3|
|Section||Semiconductors and Devices|
|Published online||15 November 2013|
Emphasis on trap activity in AlGaN/GaN HEMTs through temperature dependent pulsed I-V characteristics
IEMN-CNRS, UMR-8520, 59652 Villeneuve d’Ascq, France
a e-mail: email@example.com
Accepted: 14 October 2013
Published online: 15 November 2013
This paper reports on the temperature dependent threshold voltage analysis of AlGaN/GaN High electron mobility transistors (HEMTs) in order to investigate the trap effects occurring in these devices. Measurements are performed in pulse configuration to emphasize the gate-lag and drain-lag effects involving current collapses. A quantitative extraction of the interface traps density is performed through the observation of the pinch-off voltage shifts in cold bias conditions. Additionally, a thermally activated energy level of 0.25 eV is evaluated whatever the bias condition. It is also shown that the trap density increases drastically when the drain is biased, limiting the performance of AlGaN/GaN devices through drain-lag effect.
© EDP Sciences, 2013
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.