Issue |
Eur. Phys. J. Appl. Phys.
Volume 63, Number 1, July 2013
International Semiconductor Conference Dresden-Grenoble – ISCDG 2012
|
|
---|---|---|
Article Number | 14406 | |
Number of page(s) | 8 | |
DOI | https://doi.org/10.1051/epjap/2013120479 | |
Published online | 05 July 2013 |
https://doi.org/10.1051/epjap/2013120479
High-frequency characterization and modeling of single metallic nanowires*
IMEP-LAHC, Grenoble-INP, UJF, CNRS, US, 3 Parvis Louis Néel, BP 257, 38016 Grenoble Cedex 1, France
a e-mail: philippe.benech@leg.ensieg.inpg.fr
Received:
22
October
2012
Accepted:
9
April
2013
Published online:
5
July
2013
The transmission line characteristics of an individual aluminum metallic nanowire up to 100 GHz are presented in this paper. We have built a reliable framework for characterizing such nanowires using a specially designed coplanar waveguide platform. We systematically estimate the pad parasitics, contact impedance and transmission line parameters based on an equivalent circuit model and cascade-based de-embedding theory. This is the first time that such external parasitic elements have been successfully removed from a nanoscale transmission line. The extracted frequency-dependent electrical responses show good signal levels and a high degree of reproducibility.
© EDP Sciences, 2013
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